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*Multiple pieces shown for clarity.
$119.07 per piece
Brand / Manufacturer: LITTELFUSE ELECTRICAL FUSES
Amperage Rating: 100
Voltage: 600
Department: 24
Series: L60S
Catalog / Class: SEMICONDUCTOR
Speed: SEMICONDUCTOR
SKU: L60S-100
Category: Semiconductor
*Prices Subject to Change
100A 600V SEMICONDUC
3000A 150V SEMI FUSE Semiconductor Very Fast Acting T232363 A15QS Amp-Trap® Form 101 high speed fuses were designed for the specific protection of diodes and other semiconductor devices rated 150VAC/DC. The A15QS product line’s compact design is perfect for those applications that have limitations on available space. Low I²t minimizes damage to protected components on… Read more »
450A 700V VERY FAST
800A 700V SEMI FUSE Semiconductor Fuse, Stud-Mount, Very Fast Acting, 700VAC, IR AC 200kA, 700VDC, IR DC 50kA, 800A, 800 Amp, UL Recognized, CSA, CE, FWP 800A, FWP800A, North American Style, High Speed Fuse
80A 500V SEMI FUSE A50P Amp-Trap® Form 101 high speed fuses were developed for DC drives, uninterruptable power supplies and similar applications requiring better protection (lower I2t) and superior reliability. The A50P is typically used for replacement. Low I2t minimizes damage to protected components on short circuit Controlled arc voltage reduces stress to circuit components… Read more »
1200A 1000V SEMI FUSE A100P Amp-Trap® Form 101 high speed fuses are rated 1000V, extending the range of protection for UPS systems, AC and DC drives, reduced voltage motor starters and similar applications where lower I2t and superior reliability are needed. With ratings from 15 through 1000 amperes, a wide range of high voltage applications… Read more »
40A 500V SEMI FUSE A50P Amp-Trap® Form 101 high speed fuses were developed for DC drives, uninterruptable power supplies and similar applications requiring better protection (lower I2t) and superior reliability. The A50P is typically used for replacement. Low I2t minimizes damage to protected components on short circuit Controlled arc voltage reduces stress to circuit components… Read more »